Mimi Yiu, Chris Winstead, Vincent C. Gaudet, Christian Schlegel. Digital built-in self-test of CMOS analog iterative decoders. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 2204-2207, IEEE, 2005. [doi]
Abstract is missing.