Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power MCUs - researchr publication authors

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Yoshisato Yokoyama, Yuichiro Ishii, Koji Nii, Kazutoshi Kobayashi. Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power MCUs. IEEE Trans. VLSI Syst., 29(7):1495-1499, 2021. [doi]

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