Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power MCUs

Yoshisato Yokoyama, Yuichiro Ishii, Koji Nii, Kazutoshi Kobayashi. Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power MCUs. IEEE Trans. VLSI Syst., 29(7):1495-1499, 2021. [doi]

Abstract

Abstract is missing.