Tomokazu Yoneda, Hideo Fujiwara. Wrapper and TAM Co-Optimization for Reuse of SoC Functional Interconnects. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 1366-1369, 2008. [doi]
@inproceedings{YonedaF08,
title = {Wrapper and TAM Co-Optimization for Reuse of SoC Functional Interconnects},
author = {Tomokazu Yoneda and Hideo Fujiwara},
year = {2008},
doi = {10.1109/DATE.2008.4484929},
url = {http://dx.doi.org/10.1109/DATE.2008.4484929},
tags = {optimization, reuse},
researchr = {https://researchr.org/publication/YonedaF08},
cites = {0},
citedby = {0},
pages = {1366-1369},
booktitle = {Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008},
}