Tomokazu Yoneda, Keigo Hori, Michiko Inoue, Hideo Fujiwara. Faster-than-at-speed test for increased test quality and in-field reliability. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-9, IEEE, 2011. [doi]
Abstract is missing.