Seung-Moon Yoo, Seong-Ook Jung, Sung-Mo Kang. 2-level LFSR scheme with asynchronous test pattern transfer for low cost and high efficiency build-in-self-test. In Kaushik Roy, Sung-Mo Kang, Cheng-Kok Koh, editors, Proceedings of the 11th ACM Great Lakes Symposium on VLSI 2001, West Lafayette, Indiana, USA, 2001. pages 93-96, ACM, 2001. [doi]
Abstract is missing.