Jong-Hyeok Yoon, Muya Chang, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Arijit Raychowdhury. A 40nm 100Kb 118.44TOPS/W Ternary-weight Computein-Memory RRAM Macro with Voltage-sensing Read and Write Verification for reliable multi-bit RRAM operation. In IEEE Custom Integrated Circuits Conference, CICC 2021, Austin, TX, USA, April 25-30, 2021. pages 1-2, IEEE, 2021. [doi]
@inproceedings{YoonCKCCR21-0,
title = {A 40nm 100Kb 118.44TOPS/W Ternary-weight Computein-Memory RRAM Macro with Voltage-sensing Read and Write Verification for reliable multi-bit RRAM operation},
author = {Jong-Hyeok Yoon and Muya Chang and Win-San Khwa and Yu-Der Chih and Meng-Fan Chang and Arijit Raychowdhury},
year = {2021},
doi = {10.1109/CICC51472.2021.9431412},
url = {https://doi.org/10.1109/CICC51472.2021.9431412},
researchr = {https://researchr.org/publication/YoonCKCCR21-0},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {IEEE Custom Integrated Circuits Conference, CICC 2021, Austin, TX, USA, April 25-30, 2021},
publisher = {IEEE},
isbn = {978-1-7281-7581-2},
}