Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi. SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation. In International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023. pages 72-75, IEEE, 2023. [doi]
@inproceedings{YoshidaNSIFK23,
title = {SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation},
author = {Keita Yoshida and Ryuichi Nakajima and Shotaro Sugitani and Takafumi Ito and Jun Furuta and Kazutoshi Kobayashi},
year = {2023},
doi = {10.1109/ICICDT59917.2023.10332287},
url = {https://doi.org/10.1109/ICICDT59917.2023.10332287},
researchr = {https://researchr.org/publication/YoshidaNSIFK23},
cites = {0},
citedby = {0},
pages = {72-75},
booktitle = {International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023},
publisher = {IEEE},
isbn = {979-8-3503-1931-6},
}