Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara. Design for Testability Based on Single-Port-Change Delay Testing for Data Paths. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 254-259, IEEE Computer Society, 2005. [doi]
Abstract is missing.