Takefumi Yoshikawa, Masahiro Ishimaru, Tatsuya Iwata, Fuma Mori, Kazutoshi Kobayashi. A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment. J. Electronic Testing, 37(5):675-684, 2021. [doi]
Abstract is missing.