Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara. Fast false path identification based on functional unsensitizability using RTL information. In Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009. pages 660-665, IEEE, 2009. [doi]
Abstract is missing.