Masayoshi Yoshimura, Amy Ogita, Toshinori Hosokawa. A smart Trojan circuit and smart attack method in AES encryption circuits. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 278-283, IEEE, 2013. [doi]
Abstract is missing.