Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada. Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 287, IEEE Computer Society, 2001. [doi]
Abstract is missing.