Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita. Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. J. Electronic Testing, 21(6):613-620, 2005. [doi]

Authors

Hiroyuki Yotsuyanagi

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Toshimasa Kuchii

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Shigeki Nishikawa

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Masaki Hashizume

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Kozo Kinoshita

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