Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita. Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. J. Electronic Testing, 21(6):613-620, 2005. [doi]
@article{YotsuyanagiKNHK05,
title = {Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees},
author = {Hiroyuki Yotsuyanagi and Toshimasa Kuchii and Shigeki Nishikawa and Masaki Hashizume and Kozo Kinoshita},
year = {2005},
doi = {10.1007/s10836-005-2719-2},
url = {http://dx.doi.org/10.1007/s10836-005-2719-2},
researchr = {https://researchr.org/publication/YotsuyanagiKNHK05},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {21},
number = {6},
pages = {613-620},
}