Hiroyuki Yotsuyanagi, Hiroyuki Makimoto, Masaki Hashizume. A Boundary Scan Circuit with Time-to-Digital Converter for Delay Testing. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 539-544, IEEE Computer Society, 2011. [doi]
Abstract is missing.