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In-Situ Method for TSV Delay Testing and Characterization Using Input Sensitivity Analysis

Jhih-Wei You, Shi-Yu Huang, Yu-Hsiang Lin, Meng-Hsiu Tsai, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu. In-Situ Method for TSV Delay Testing and Characterization Using Input Sensitivity Analysis. IEEE Trans. VLSI Syst., 21(3):443-453, 2013. [doi]

Authors

Jhih-Wei You

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Shi-Yu Huang

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Yu-Hsiang Lin

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Meng-Hsiu Tsai

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Ding-Ming Kwai

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Yung-Fa Chou

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Cheng-Wen Wu

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