Yan-Shen You, Chih-Yan Liu, Mu-Ting Wu, Po-Wei Chen, James Chien-Mo Li. Diagnosis technique for Clustered Multiple Transition Delay Faults. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 53-58, IEEE, 2020. [doi]
@inproceedings{YouLWCL20,
title = {Diagnosis technique for Clustered Multiple Transition Delay Faults},
author = {Yan-Shen You and Chih-Yan Liu and Mu-Ting Wu and Po-Wei Chen and James Chien-Mo Li},
year = {2020},
doi = {10.1109/ITC-Asia51099.2020.00021},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00021},
researchr = {https://researchr.org/publication/YouLWCL20},
cites = {0},
citedby = {0},
pages = {53-58},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8944-4},
}