M. Yousefi, Qiugang Lu, R. Bhushan Gopaluni, Philip D. Loewen, Michael G. Forbes, Guy A. Dumont, Johan U. Backström. Detecting model-plant mismatch without external excitation. In American Control Conference, ACC 2015, Chicago, IL, USA, July 1-3, 2015. pages 4976-4981, IEEE, 2015. [doi]
Abstract is missing.