Qiaoyan Yu, Paul Ampadu. Dual-Layer Cooperative Error Control for Reliable Nanoscale Networks-on-Chip. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 431-439, IEEE Computer Society, 2009. [doi]
Abstract is missing.