High-cycle fatigue life prediction for Pb-free BGA under random vibration loading

Da Yu, Abdullah Al-Yafawi, Tung T. Nguyen, SeungBae Park, Soonwan Chung. High-cycle fatigue life prediction for Pb-free BGA under random vibration loading. Microelectronics Reliability, 51(3):649-656, 2011. [doi]

Authors

Da Yu

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Abdullah Al-Yafawi

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Tung T. Nguyen

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SeungBae Park

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Soonwan Chung

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