High-cycle fatigue life prediction for Pb-free BGA under random vibration loading

Da Yu, Abdullah Al-Yafawi, Tung T. Nguyen, SeungBae Park, Soonwan Chung. High-cycle fatigue life prediction for Pb-free BGA under random vibration loading. Microelectronics Reliability, 51(3):649-656, 2011. [doi]

Abstract

Abstract is missing.