High-cycle fatigue life prediction for Pb-free BGA under random vibration loading

Da Yu, Abdullah Al-Yafawi, Tung T. Nguyen, SeungBae Park, Soonwan Chung. High-cycle fatigue life prediction for Pb-free BGA under random vibration loading. Microelectronics Reliability, 51(3):649-656, 2011. [doi]

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