Baozhen Yu, Michael L. Bushnell. A novel dynamic power cutoff technique (DPCT) for active leakage reduction in deep submicron CMOS circuits. In Wolfgang Nebel, Mircea R. Stan, Anand Raghunathan, Jörg Henkel, Diana Marculescu, editors, Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006, Tegernsee, Bavaria, Germany, October 4-6, 2006. pages 214-219, ACM, 2006. [doi]
@inproceedings{YuB06:2,
title = {A novel dynamic power cutoff technique (DPCT) for active leakage reduction in deep submicron CMOS circuits},
author = {Baozhen Yu and Michael L. Bushnell},
year = {2006},
doi = {10.1145/1165573.1165627},
url = {http://doi.acm.org/10.1145/1165573.1165627},
researchr = {https://researchr.org/publication/YuB06%3A2},
cites = {0},
citedby = {0},
pages = {214-219},
booktitle = {Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006, Tegernsee, Bavaria, Germany, October 4-6, 2006},
editor = {Wolfgang Nebel and Mircea R. Stan and Anand Raghunathan and Jörg Henkel and Diana Marculescu},
publisher = {ACM},
isbn = {1-59593-462-6},
}