Baozhen Yu, Michael L. Bushnell. A novel dynamic power cutoff technique (DPCT) for active leakage reduction in deep submicron CMOS circuits. In Wolfgang Nebel, Mircea R. Stan, Anand Raghunathan, Jörg Henkel, Diana Marculescu, editors, Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006, Tegernsee, Bavaria, Germany, October 4-6, 2006. pages 214-219, ACM, 2006. [doi]
Abstract is missing.