Xiaochun Yu, Ronald D. Blanton. An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-9, IEEE, 2008. [doi]
Abstract is missing.