Algorithm for dramatically improved efficiency in ADC linearity test

Zhongjun Yu, Degang Chen. Algorithm for dramatically improved efficiency in ADC linearity test. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]

Authors

Zhongjun Yu

This author has not been identified. Look up 'Zhongjun Yu' in Google

Degang Chen

This author has not been identified. Look up 'Degang Chen' in Google