Zhongjun Yu, Degang Chen. Algorithm for dramatically improved efficiency in ADC linearity test. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]
@inproceedings{YuC12-11, title = {Algorithm for dramatically improved efficiency in ADC linearity test}, author = {Zhongjun Yu and Degang Chen}, year = {2012}, doi = {10.1109/TEST.2012.6401561}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401561}, researchr = {https://researchr.org/publication/YuC12-11}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-1594-4}, }