Algorithm for dramatically improved efficiency in ADC linearity test

Zhongjun Yu, Degang Chen. Algorithm for dramatically improved efficiency in ADC linearity test. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]

@inproceedings{YuC12-11,
  title = {Algorithm for dramatically improved efficiency in ADC linearity test},
  author = {Zhongjun Yu and Degang Chen},
  year = {2012},
  doi = {10.1109/TEST.2012.6401561},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401561},
  researchr = {https://researchr.org/publication/YuC12-11},
  cites = {0},
  citedby = {0},
  pages = {1-10},
  booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4673-1594-4},
}