On-chip Jitter Measurement Using Vernier Ring Time-to-Digital Converter

Jianjun Yu, Fa Foster Dai. On-chip Jitter Measurement Using Vernier Ring Time-to-Digital Converter. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 167-170, IEEE Computer Society, 2010. [doi]

Authors

Jianjun Yu

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Fa Foster Dai

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