Jianjun Yu, Fa Foster Dai. On-chip Jitter Measurement Using Vernier Ring Time-to-Digital Converter. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 167-170, IEEE Computer Society, 2010. [doi]
@inproceedings{YuD10-4,
title = {On-chip Jitter Measurement Using Vernier Ring Time-to-Digital Converter},
author = {Jianjun Yu and Fa Foster Dai},
year = {2010},
doi = {10.1109/ATS.2010.38},
url = {http://dx.doi.org/10.1109/ATS.2010.38},
researchr = {https://researchr.org/publication/YuD10-4},
cites = {0},
citedby = {0},
pages = {167-170},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}