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Differential Evolution Algorithm With Asymmetric Coding for Solving the Reliability Problem of 3D-TLC CT Flash-Memory Storage Systems

David Kuang-Hui Yu, Jen-Wei Hsieh. Differential Evolution Algorithm With Asymmetric Coding for Solving the Reliability Problem of 3D-TLC CT Flash-Memory Storage Systems. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(9):2863-2876, 2022. [doi]

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