Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature Extraction - researchr publication

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Yen-Ting Yu, Geng-He Lin, Iris Hui-Ru Jiang, Charles Chiang. Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature Extraction. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(3):460-470, 2015. [doi]

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