A method for detecting outliers in functional data - researchr publication authors

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Fengmin Yu, Liming Liu, Liying Jin, Nanxiang Yu, hua Shang. A method for detecting outliers in functional data. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 7405-7410, IEEE, 2017. [doi]

This author has not been identified. Look up 'Fengmin Yu' in GoogleThis author has not been identified. Look up 'Liming Liu' in GoogleThis author has not been identified. Look up 'Liying Jin' in GoogleThis author has not been identified. Look up 'Nanxiang Yu' in GoogleThis author has not been identified. Look up 'hua Shang' in Google

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