A method for detecting outliers in functional data

Fengmin Yu, Liming Liu, Liying Jin, Nanxiang Yu, hua Shang. A method for detecting outliers in functional data. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 7405-7410, IEEE, 2017. [doi]

Abstract

Abstract is missing.