Fengmin Yu, Liming Liu, Liying Jin, Nanxiang Yu, hua Shang. A method for detecting outliers in functional data. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 7405-7410, IEEE, 2017. [doi]
@inproceedings{YuLJYS17,
title = {A method for detecting outliers in functional data},
author = {Fengmin Yu and Liming Liu and Liying Jin and Nanxiang Yu and hua Shang},
year = {2017},
doi = {10.1109/IECON.2017.8217297},
url = {https://doi.org/10.1109/IECON.2017.8217297},
researchr = {https://researchr.org/publication/YuLJYS17},
cites = {0},
citedby = {0},
pages = {7405-7410},
booktitle = {IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017},
publisher = {IEEE},
isbn = {978-1-5386-1127-2},
}