Hsueh-Ling Yu, Yih-Lang Li, Tzu-Yi Liao, Tianchen Wang, Yiyu Shi, Shu-Fei Tsai. Fast and accurate emissivity and absolute temperature maps measurement for integrated circuits. In Yao-Wen Chang, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014, San Jose, CA, USA, November 3-6, 2014. pages 542-549, IEEE/ACM, 2014. [doi]
Abstract is missing.