Tailoring CUTLASS GEMM using Supervised Learning

Yongseung Yu, Donghyun Son, Younghyun Lee, Sunghyun Park, Giha Ryu, Myeongjin Cho, Jiwon Seo 0002, Yongjun Park 0001. Tailoring CUTLASS GEMM using Supervised Learning. In 41st IEEE International Conference on Computer Design, ICCD 2023, Washington, DC, USA, November 6-8, 2023. pages 465-474, IEEE, 2023. [doi]

Authors

Yongseung Yu

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Donghyun Son

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Younghyun Lee

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Sunghyun Park

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Giha Ryu

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Myeongjin Cho

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Jiwon Seo 0002

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Yongjun Park 0001

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