Yongseung Yu, Donghyun Son, Younghyun Lee, Sunghyun Park, Giha Ryu, Myeongjin Cho, Jiwon Seo 0002, Yongjun Park 0001. Tailoring CUTLASS GEMM using Supervised Learning. In 41st IEEE International Conference on Computer Design, ICCD 2023, Washington, DC, USA, November 6-8, 2023. pages 465-474, IEEE, 2023. [doi]
@inproceedings{YuSLPRC0023,
title = {Tailoring CUTLASS GEMM using Supervised Learning},
author = {Yongseung Yu and Donghyun Son and Younghyun Lee and Sunghyun Park and Giha Ryu and Myeongjin Cho and Jiwon Seo 0002 and Yongjun Park 0001},
year = {2023},
doi = {10.1109/ICCD58817.2023.00077},
url = {https://doi.org/10.1109/ICCD58817.2023.00077},
researchr = {https://researchr.org/publication/YuSLPRC0023},
cites = {0},
citedby = {0},
pages = {465-474},
booktitle = {41st IEEE International Conference on Computer Design, ICCD 2023, Washington, DC, USA, November 6-8, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4291-8},
}