The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM

Wenxin Yu, Yongbo Sui, Junnian Wang. The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM. J. Electronic Testing, 32(4):459-465, 2016. [doi]

Authors

Wenxin Yu

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Yongbo Sui

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Junnian Wang

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