Wenxin Yu, Yongbo Sui, Junnian Wang. The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM. J. Electronic Testing, 32(4):459-465, 2016. [doi]
@article{YuSW16,
title = {The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM},
author = {Wenxin Yu and Yongbo Sui and Junnian Wang},
year = {2016},
doi = {10.1007/s10836-016-5597-x},
url = {http://dx.doi.org/10.1007/s10836-016-5597-x},
researchr = {https://researchr.org/publication/YuSW16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {4},
pages = {459-465},
}