ZeroScreen: A Novel Structure for IC Reliability Screening at Time-Zero

Liting Yu, Xiaoxiao Wang. ZeroScreen: A Novel Structure for IC Reliability Screening at Time-Zero. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]

Abstract

Abstract is missing.