Haile Yu, Qiang Xu, Philip Heng Wai Leong. Fine-grained characterization of process variation in FPGAs. In Jinian Bian, Qiang Zhou, Peter Athanas, Yajun Ha, Kang Zhao, editors, Proceedings of the International Conference on Field-Programmable Technology, FPT 2010, 8-10 December 2010, Tsinghua University, Beijing, China. pages 138-145, IEEE, 2010. [doi]
Abstract is missing.