Thomas Edison Yu, Tomokazu Yoneda, Krishnendu Chakrabarty, Hideo Fujiwara. Test infrastructure design for core-based system-on-chip under cycle-accurate thermal constraints. In Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009. pages 793-798, IEEE, 2009. [doi]
@inproceedings{YuYCF09,
title = {Test infrastructure design for core-based system-on-chip under cycle-accurate thermal constraints},
author = {Thomas Edison Yu and Tomokazu Yoneda and Krishnendu Chakrabarty and Hideo Fujiwara},
year = {2009},
doi = {10.1145/1509633.1509810},
url = {http://doi.acm.org/10.1145/1509633.1509810},
tags = {testing, constraints, design},
researchr = {https://researchr.org/publication/YuYCF09},
cites = {0},
citedby = {0},
pages = {793-798},
booktitle = {Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009},
publisher = {IEEE},
isbn = {978-1-4244-2748-2},
}