Thomas Edison Yu, Tomokazu Yoneda, Krishnendu Chakrabarty, Hideo Fujiwara. Test infrastructure design for core-based system-on-chip under cycle-accurate thermal constraints. In Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009. pages 793-798, IEEE, 2009. [doi]
Abstract is missing.