Thomas Edison Yu, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara. Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle Paths. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 125-130, IEEE Computer Society, 2008. [doi]
@inproceedings{YuYOF08,
title = {Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle Paths},
author = {Thomas Edison Yu and Tomokazu Yoneda and Satoshi Ohtake and Hideo Fujiwara},
year = {2008},
doi = {10.1109/ATS.2008.55},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.55},
researchr = {https://researchr.org/publication/YuYOF08},
cites = {0},
citedby = {0},
pages = {125-130},
booktitle = {17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3396-4},
}