Thomas Edison Yu, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara. Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle Paths. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 125-130, IEEE Computer Society, 2008. [doi]
Abstract is missing.