Panpan Yu, Ying Zhou, Ling Sun, Jianjun Gao. A simple semi-analytical parameter extraction method for 40nm gatelength MOSFET. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.