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SMA-YOLO: A Defect Detection Algorithm for Self-Explosion of Insulators Under Complex Backgrounds

Kaiyue Yu, Lei Zhao, Xiaojun Xue, Heng Li, Hui Liu. SMA-YOLO: A Defect Detection Algorithm for Self-Explosion of Insulators Under Complex Backgrounds. IEEE Access, 13:163778-163795, 2025. [doi]

Authors

Kaiyue Yu

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Lei Zhao

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Xiaojun Xue

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Heng Li

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Hui Liu

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