SMA-YOLO: A Defect Detection Algorithm for Self-Explosion of Insulators Under Complex Backgrounds

Kaiyue Yu, Lei Zhao, Xiaojun Xue, Heng Li, Hui Liu. SMA-YOLO: A Defect Detection Algorithm for Self-Explosion of Insulators Under Complex Backgrounds. IEEE Access, 13:163778-163795, 2025. [doi]

Abstract

Abstract is missing.