Kaiyue Yu, Lei Zhao, Xiaojun Xue, Heng Li, Hui Liu. SMA-YOLO: A Defect Detection Algorithm for Self-Explosion of Insulators Under Complex Backgrounds. IEEE Access, 13:163778-163795, 2025. [doi]
@article{YuZXLL25,
title = {SMA-YOLO: A Defect Detection Algorithm for Self-Explosion of Insulators Under Complex Backgrounds},
author = {Kaiyue Yu and Lei Zhao and Xiaojun Xue and Heng Li and Hui Liu},
year = {2025},
doi = {10.1109/ACCESS.2025.3609906},
url = {https://doi.org/10.1109/ACCESS.2025.3609906},
researchr = {https://researchr.org/publication/YuZXLL25},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {13},
pages = {163778-163795},
}